Crack identification in beam structures using both mechanical impedance and eigenfrequency changes
Bamnios, George/ Douka, Eleni/ Trochidis, Athanasios/ Τροχίδης, Αθανάσιος/ Μπάνιος, Γιώργος/ Δουκά, Ελένη
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Issue Date: | 2001 |
| Citation: | National Conference on Recent Advances in Mechanical Engineering, Patras, 2001 |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικής, 2001 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10018 |
| Other Identifiers: | http://www.sciencedirect.com/science/article/pii/S0022460X01942099 10.1006/jsvi.2001.4209 |
| Item type: | other |
| Submission Date: | 2018-02-28T16:17:39Z |
| Item language: | el |
| Item access scheme: | free |
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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http://195.251.240.227/jspui/handle/123456789/10018
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