Impact of Parameter Covariance on Fault Detectability Estimation of Analog and Mixed-Mode Circuits
Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.date.accessioned | 2015-07-03T10:04:41Z | el |
| dc.date.accessioned | 2018-02-28T16:16:41Z | - |
| dc.date.available | 2015-07-03T10:04:41Z | el |
| dc.date.available | 2018-02-28T16:16:41Z | - |
| dc.date.issued | 2003-10 | el |
| dc.identifier | 10.1049/ip-cds:20030579 | el |
| dc.identifier.citation | Journal: Circuits, Devices and Systems, IEE Proceedings, vol.150, no.5, 2003 | el |
| dc.identifier.citation | Papakostas, D. and Hatzopoulos, A. (2003). Impact of Parameter Covariance on Fault Detectability Estimation of Analog and Mixed-Mode Circuits. Circuits, Devices and Systems, IEE Proceedings [online]. 150(5), pp.434-438. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=1251665&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F2190%2F28023%2F01251665.pdf%3Farnumber%3D1251665 [Ανακτήθηκε 19 Ιουλίου 2015] | el |
| dc.identifier.issn | 1350-2409 | el |
| dc.identifier.issn | 1359-7000 | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10025 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2003 | el |
| dc.description.abstract | An extension to the method for estimating the fault detection probability, in order to include circuit parameters with covariance, is studied. The enhanced method takes into account the statistical variations and matching dependencies between circuit parameters and gives quite accurate and realistic results, while additional circuit simulations, compared to the previous method, are needed. The method is applied for the estimation of fault detectability in a simulation-before-test approach. Comparative results from analogue and mixed-mode circuits are presented to evaluate the contribution of the extended formulation. | el |
| dc.language.iso | en | el |
| dc.publisher | Institution of Education and Technology | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.source.uri | http://www.ieeeexplore.ws/xpl/RecentIssue.jsp?punumber=2190 | el |
| dc.subject | Mixed analogue-digital integrated circuits | el |
| dc.subject | Fault diagnosis | el |
| dc.subject | Network parameters | el |
| dc.subject | Circuit simulation | el |
| dc.title | Impact of Parameter Covariance on Fault Detectability Estimation of Analog and Mixed-Mode Circuits | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:41Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
Files in This Item:
There are no files associated with this item.
Please use this identifier to cite or link to this item:
This item is a favorite for 0 people.
http://195.251.240.227/jspui/handle/123456789/10025
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
