Current-based Testing of Optical Feedback Pixel Driver
Papadopoulos, Nikolaos/ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Παπαδόπουλος, Νικόλαος
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Papadopoulos, Nikolaos | el |
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.contributor.other | Παπαδόπουλος, Νικόλαος | el |
| dc.date.accessioned | 2015-07-03T12:14:14Z | el |
| dc.date.accessioned | 2018-02-28T16:16:41Z | - |
| dc.date.available | 2015-07-03T12:14:14Z | el |
| dc.date.available | 2018-02-28T16:16:41Z | - |
| dc.date.issued | 2010-04 | el |
| dc.identifier | 10.1109/JDT.2009.2039986 | el |
| dc.identifier.citation | Papakostas, D., Papadopoulos, N. and Hatzopoulos, A. (2010). Current-based Testing of Optical Feedback Pixel Driver. Journal of Display Technology [online]. 6(4), pp.150-157. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5438918&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F9425%2F5431077%2F05438918.pdf%3Farnumber%3D5438918 [Ανακτήθηκε 19 Ιουλίου 2015] | el |
| dc.identifier.citation | Journal: Journal of Display Technology, vol.6, no.4, 2010 | el |
| dc.identifier.issn | 1551-319X | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10026 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2010 | el |
| dc.description.abstract | A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I pixel current (which is proportional to I oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE. | el |
| dc.language.iso | en | el |
| dc.publisher | IEEE | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.source.uri | https://www.osapublishing.org/jdt/home.cfm | el |
| dc.subject | Thin film transistors | el |
| dc.subject | Pulse width modulation | el |
| dc.subject | Organic light emitting diodes | el |
| dc.subject | Optical feedback | el |
| dc.subject | Driver circuits | el |
| dc.subject | Circuit testing | el |
| dc.title | Current-based Testing of Optical Feedback Pixel Driver | el |
| dc.type | Article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:41Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
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