A Light-impact Model for p-type and n-type poly-Si TFTs
Siskos, Stylianos/ Dimitriadis, Charalampos/ Picos, Rodrigo/ Papadopoulos, Nikolaos/ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Σίσκος, Στυλιανός/ Δημητριάδης, Χαράλαμπος/ Παπαδόπουλος, Νικόλαος
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Siskos, Stylianos | el |
dc.contributor.author | Dimitriadis, Charalampos | el |
dc.contributor.author | Picos, Rodrigo | el |
dc.contributor.author | Papadopoulos, Nikolaos | el |
dc.contributor.author | Hatzopoulos, Alkiviadis | el |
dc.contributor.author | Papakostas, Dimitrios | el |
dc.contributor.other | Παπακώστας, Δημήτριος | el |
dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
dc.contributor.other | Σίσκος, Στυλιανός | el |
dc.contributor.other | Δημητριάδης, Χαράλαμπος | el |
dc.contributor.other | Παπαδόπουλος, Νικόλαος | el |
dc.date.accessioned | 2015-07-06T10:57:44Z | el |
dc.date.accessioned | 2018-02-28T16:16:43Z | - |
dc.date.available | 2015-07-06T10:57:44Z | el |
dc.date.available | 2018-02-28T16:16:43Z | - |
dc.date.issued | 2009-07 | el |
dc.identifier | 10.1109/JDT.2009.2015898 | el |
dc.identifier.citation | Journal: Journal of Display Technology, vol.5, no.7, 2009 | el |
dc.identifier.citation | Papakostas, D., Hatzopoulos, A., Papadopoulos, N., Dimitriadis, C. and Picos, R. (2009). A Light-impact Model for p-type and n-type poly-Si TFTs. Journal of Display Technology [online]. 5(7), pp.265-272 | el |
dc.identifier.issn | 1551-319X | el |
dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10038 | - |
dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2009 | el |
dc.description.abstract | This paper introduces and verifies a new light-impact model (LIM) for both p-type and n-type polycrystalline thin-film transistors (poly-Si TFTs). The ratio of the produced current under a specific light intensity (Id) over the dark current (Idark) is calculated. The new model has been also implemented in the circuit simulation program HSPICE. Comparative results between measurements and simulated characteristics are presented for different sizes of widths/lengths, different values of the Vds and Vgs voltages and of light intensities. | el |
dc.language.iso | en | el |
dc.publisher | IEEE | el |
dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
dc.rights | This item is probably protected by Copyright Legislation | el |
dc.source.uri | https://www.osapublishing.org/jdt/home.cfm | el |
dc.subject | Elemental semiconductors | el |
dc.subject | Spice | el |
dc.subject | Silicon | el |
dc.subject | Thin film transistors | el |
dc.title | A Light-impact Model for p-type and n-type poly-Si TFTs | el |
dc.type | Article | el |
heal.type | other | el |
heal.type.en | Other | en |
heal.dateAvailable | 2018-02-28T16:17:43Z | - |
heal.language | el | el |
heal.access | free | el |
heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
heal.fullTextAvailability | false | el |
heal.type.el | Άλλο | el |
Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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http://195.251.240.227/jspui/handle/123456789/10038
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