Supply current testing in linear bipolar ICs
Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Keywords: | Bipolar integrated circuits;Electric current measurement;Fault location;Linear integrated circuits;Integrated circuit testing;Operational amplifiers |
| Issue Date: | 20-Jan-1994 |
| Publisher: | Institution of Education and Technology |
| Citation: | Journal: Electronics Letters, vol.30, no.2, 1994 Papakostas, D. and Hatzopoulos, A. (1994). Supply current testing in linear bipolar ICs. Electronics Letters [online]. 30(2), pp.128-130. Διαθέσιμο σε: http://digital-library.theiet.org/content/journals/10.1049/el_19940088 [Ανακτήθηκε 19 Ιουλίου 2015] |
| Abstract: | Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for a representative (741 type) opamp. The circuit is simulated under both linear and nonlinear operation. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method. |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1994 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10039 |
| ISSN: | 1350-911X 0013-5194 |
| Other Identifiers: | 10.1049/el:19940088 |
| Item type: | other |
| Submission Date: | 2018-02-28T16:17:43Z |
| Item language: | el |
| Item access scheme: | free |
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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