Estimation of Statistical Variables for analogue fault detectability evaluation
Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.date.accessioned | 2015-07-03T09:42:14Z | el |
| dc.date.accessioned | 2018-02-28T16:16:43Z | - |
| dc.date.available | 2015-07-03T09:42:14Z | el |
| dc.date.available | 2018-02-28T16:16:43Z | - |
| dc.date.issued | 1999-12 | el |
| dc.identifier | 10.1049/ip-cds:19990581 | el |
| dc.identifier.citation | Journal: Circuits, Devices and Systems, IEE Proceedings, vol.146, no.6, 1999 | el |
| dc.identifier.citation | Papakostas, D. and Chatzopoulos, A. (1999). Estimation of Statistical Variables for analogue fault detectability evaluation. Circuits, Devices and Systems, IEE Proceedings [online]. 146(6), pp.350-354. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=819802&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D819802 [Ανακτήθηκε 19 Ιουλίου 2015] | el |
| dc.identifier.issn | 1350-2409 | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10041 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1999 | el |
| dc.description.abstract | An efficient method for estimating the mean value and standard deviation of output measurements is introduced. It takes into account statistical variations of component values and gives accurate and realistic results with less computational time compared with the Monte Carlo technique. A method for the estimation of fault detectability of output measurements in a simulation-before-test approach is proposed. Results from four different circuits show the effectiveness of the methods in selecting the measurement with the highest detectability among a given set and also their application for input stimulus selection. | el |
| dc.language.iso | en | el |
| dc.publisher | Institution of Education and Technology | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.source.uri | http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=2190 | el |
| dc.subject | Circuit simulation | el |
| dc.subject | Αnalogue integrated circuits | el |
| dc.subject | Monte Carlo methods | el |
| dc.subject | Integrated circuit testing | el |
| dc.subject | Integrated circuit measurement | el |
| dc.subject | Fault diagnosis | el |
| dc.title | Estimation of Statistical Variables for analogue fault detectability evaluation | el |
| dc.type | Article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:43Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
Files in This Item:
There are no files associated with this item.
Please use this identifier to cite or link to this item:
This item is a favorite for 0 people.
http://195.251.240.227/jspui/handle/123456789/10041
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
