Estimation of Circuit Output Measurements including Statistically Depended Parameters
Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Papakostas, Dimitrios | el |
dc.contributor.author | Hatzopoulos, Alkiviadis | el |
dc.contributor.other | Παπακώστας, Δημήτριος | el |
dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
dc.date.accessioned | 2015-07-03T09:57:43Z | el |
dc.date.accessioned | 2018-02-28T16:16:43Z | - |
dc.date.available | 2015-07-03T09:57:43Z | el |
dc.date.available | 2018-02-28T16:16:43Z | - |
dc.date.issued | 2003-03 | el |
dc.identifier | 10.1002/cta.218 | el |
dc.identifier.citation | Journal: International Journal of Circuit Theory and Applications, vol.31, no.2, 2003 | el |
dc.identifier.citation | Papakostas, D. and Hatzopoulos, A. (2003). Estimation of Circuit Output Measurements including Statistically Depended Parameters. International Journal of Circuit Theory and Applications [online]. 31(2), pp.219-228. Διαθέσιμο σε: http://onlinelibrary.wiley.com/doi/10.1002/cta.218/pdf [Ανακτήθηκε 19 Ιουλίου 2015] | el |
dc.identifier.issn | 1097-007X | el |
dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10042 | - |
dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2003 | el |
dc.description.abstract | An extension to the method for estimating statistical variables of output measurements, in order to take into account the statistical variations and matching dependencies between circuit parameters, is studied. The enhanced method results in sufficient estimations, while additional circuit simulations are needed. Comparative results from the application of the method and of the Monte-Carlo analysis on three analogue circuits are presented to show the effectiveness of the extended method. | el |
dc.language.iso | en | el |
dc.publisher | Wiley Online Library | el |
dc.rights | Attribution-NonCommercial-Share Alike 3.0 Greece | el |
dc.rights | Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Παρόμοια Διανομή 3.0 Ελλάδα | el |
dc.source.uri | http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1097-007X | el |
dc.subject | Statistical circuit analysis | el |
dc.subject | Analogue circuits | el |
dc.subject | Monte-Carlo technique | el |
dc.title | Estimation of Circuit Output Measurements including Statistically Depended Parameters | el |
dc.type | Article | el |
heal.type | other | el |
heal.type.en | Other | en |
heal.dateAvailable | 2018-02-28T16:17:43Z | - |
heal.language | el | el |
heal.access | free | el |
heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
heal.fullTextAvailability | false | el |
heal.type.el | Άλλο | el |
Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
Files in This Item:
There are no files associated with this item.
Please use this identifier to cite or link to this item:
This item is a favorite for 0 people.
http://195.251.240.227/jspui/handle/123456789/10042
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.