Improved Analogue Fault Coverage Estimation using Probabilistic Analysis
Chatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chatzopoulos, Alkiviadis | el |
dc.contributor.author | Papakostas, Dimitrios | el |
dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
dc.contributor.other | Παπακώστας, Δημήτριος | el |
dc.date.accessioned | 2015-07-03T10:32:33Z | el |
dc.date.accessioned | 2018-02-28T16:16:44Z | - |
dc.date.available | 2015-07-03T10:32:33Z | el |
dc.date.available | 2018-02-28T16:16:44Z | - |
dc.date.issued | 2010-06 | el |
dc.identifier | 10.1002/cta.586 | el |
dc.identifier.citation | Papakostas, D. and Chatzopoulos, A. (2010). Improved Analogue Fault Coverage Estimation using Probabilistic Analysis. International Journal of Circuit Theory and Applications [online]. 38(5), pp.503-514. Διαθέσιμο σε: http://onlinelibrary.wiley.com/doi/10.1002/cta.586/abstract [Ανακτήθηκε 19 Ιουλίου 2015] | el |
dc.identifier.citation | Journal: International Journal of Circuit Theory and Applications, vol.38, no.5, 2010 | el |
dc.identifier.issn | 1097-007X | el |
dc.identifier.issn | 0098-9886 | el |
dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10046 | - |
dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2010 | el |
dc.description.abstract | A method for fault detection probability estimation using statistical multi-parameter circuit simulation is proposed, in order to check circuits for which double or multiple analogue measurements are utilized. Theoretical analysis for the estimation of the fault coverage is given, based on conditional probability calculations. The proposed method can be applied for both test measurement and input stimulus selection. Simulation results from the application of the method on typical analogue circuits—filter and amplifier—are given, showing a sufficient improvement over the fault coverage achieved by single measurements. | el |
dc.language.iso | en | el |
dc.publisher | Wiley Online Library | el |
dc.rights | This item is probably protected by Copyright Legislation | el |
dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
dc.source.uri | http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1097-007X | el |
dc.subject | Probabilistic analysis | el |
dc.subject | Analogue fault coverage | el |
dc.subject | Analogue circuits | el |
dc.subject | Statistical circuit analysis | el |
dc.title | Improved Analogue Fault Coverage Estimation using Probabilistic Analysis | el |
dc.type | Article | el |
heal.type | other | el |
heal.type.en | Other | en |
heal.dateAvailable | 2018-02-28T16:17:44Z | - |
heal.language | el | el |
heal.access | free | el |
heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
heal.fullTextAvailability | false | el |
heal.type.el | Άλλο | el |
Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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