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Testing of Analog and Mixed-Signal Circuits by using Supply Current Measurements

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Iatrou, E./ Katsaras, C./ Παπακώστας, Δημήτριος/ Ιατρού, Ε./ Χατζόπουλος, Αλκιβιάδης/ Κατσάρας, Χ.

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dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.authorIatrou, E.el
dc.contributor.authorKatsaras, C.el
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.contributor.otherΙατρού, Ε.el
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.contributor.otherΚατσάρας, Χ.el
dc.date.accessioned2015-07-06T10:11:06Zel
dc.date.accessioned2018-02-28T16:16:44Z-
dc.date.available2015-07-06T10:11:06Zel
dc.date.available2018-02-28T16:16:44Z-
dc.date.issued1998-10el
dc.identifier10.1049/ip-cds:19982118el
dc.identifier.citationJournal: Circuits, Devices and Systems, IEE Proceedings, vol.145, no.5, 1998el
dc.identifier.citationPapakostas, D., Chatzopoulos, A., Iatrou, E. and Katsaras, C. (1998). Testing of Analog and Mixed-Signal Circuits by using Supply Current Measurements. Circuits, Devices and Systems, IEE Proceedings [online]. 45(5), pp.319-324. Διαθέσιμο σε: http://www.ieeeexplore.ws/xpl/articleDetails.jsp?&arnumber=739674 [Ανακτήθηκε 19 Ιουλίου 2015]el
dc.identifier.issn1359-7000el
dc.identifier.issn1350-2409el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10051-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1998el
dc.description.abstractA complete (hardware and software) system has been designed and implemented, which can measure the supply current (IPS) of analogue and mixed-mode circuits and detect or diagnose faults, based on RMS and spectrum calculations of the IPS and the corresponding fault dictionary. The system is applied to testing and diagnosis of various analogue and mixed-signal circuits, showing very encouraging results.el
dc.language.isoenel
dc.publisherInstitution of Education and Technologyel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.source.urihttp://www.ieeeexplore.ws/xpl/RecentIssue.jsp?punumber=2190el
dc.subjectElectric current measurementel
dc.subjectMixed analogue-digital integrated circuitsel
dc.subjectAnalogue integrated circuitsel
dc.subjectFault diagnosisel
dc.subjectIntegrated circuit testingel
dc.titleTesting of Analog and Mixed-Signal Circuits by using Supply Current Measurementsel
dc.typeArticleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:44Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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