Analog Fault Detectability based on Statistical Circuit Analysis

Analog Fault Detectability based on Statistical Circuit Analysis

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Kosmidis, V./ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος/ Κοσμίδης, Β.

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DC Field	Value	Language
dc.contributor.author	Papakostas, Dimitrios	el
dc.contributor.author	Hatzopoulos, Alkiviadis	el
dc.contributor.author	Kosmidis, V.	el
dc.contributor.other	Χατζόπουλος, Αλκιβιάδης	el
dc.contributor.other	Παπακώστας, Δημήτριος	el
dc.contributor.other	Κοσμίδης, Β.	el
dc.date.accessioned	2015-07-07T09:56:08Z	el
dc.date.accessioned	2018-02-28T16:16:45Z	-
dc.date.available	2015-07-07T09:56:08Z	el
dc.date.available	2018-02-28T16:16:45Z	-
dc.date.issued	1996-10	el
dc.identifier	10.1109/ICECS.1996.584607	el
dc.identifier.citation	Papakostas, D., Hatzopoulos, A. and Kosmidis, V. (1996). Analog fault detectability based on statistical circuit analysis. IEEE International Conference on Electronics, Circuits, and Systems [online]. vol.5, pp.1076-1079. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=584607&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D584607 [Ανακτήθηκε 19 Ιουλίου 2015]	el
dc.identifier.citation	International Conference on Electronics Circuits and Systems, Rhodes, 1996	el
dc.identifier.issn	0-7803-3650-X	el
dc.identifier.uri	http://195.251.240.227/jspui/handle/123456789/10052	-
dc.description	Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1996	el
dc.description.abstract	Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability of various analog measurements. Since the method is a simulation-before-test approach, its computational complexity can be considered acceptable utilizing modern computer systems. Parameter deviations and multiple Monte-Carlo analysis are properly handled by a shell program, named MPCAP, which uses the SPICE simulator as a kernel. Theoretical analysis for the calculation of the probabilities is given, along with simulation results from an analog filter example.	el
dc.language.iso	en	el
dc.publisher	IEEE	el
dc.relation.isbasedon	3rd IEEE International Conference on Electronics, Circuits, and Systems	el
dc.rights	Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία	el
dc.rights	This item is probably protected by Copyright Legislation	el
dc.subject	Statistical analysis	el
dc.subject	Monte Carlo methods	el
dc.subject	Analogue integrated circuits	el
dc.subject	Automatic testing	el
dc.subject	Circuit analysis computing	el
dc.subject	Fault diagnosis	el
dc.subject	Integrated circuit testing	el
dc.subject	Probability	el
dc.title	Analog Fault Detectability based on Statistical Circuit Analysis	el
dc.type	Conference article	el
heal.type	other	el
heal.type.en	Other	en
heal.dateAvailable	2018-02-28T16:17:45Z	-
heal.language	el	el
heal.access	free	el
heal.recordProvider	ΤΕΙ Θεσσαλονίκης	el
heal.fullTextAvailability	false	el
heal.type.el	Άλλο	el
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Analog Fault Detectability based on Statistical Circuit Analysis

Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Kosmidis, V./ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος/ Κοσμίδης, Β.