Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region

Hatzopoulos, Alkiviadis/ Siskos, Stylianos/ Dimitriadis, Charalampos/ Papadopoulos, Nikolaos/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Σίσκος, Στυλιανός/ Παπαδόπουλος, Νικόλαος/ Δημητριάδης, Χαράλαμπος

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DC Field	Value	Language
dc.contributor.author	Hatzopoulos, Alkiviadis	el
dc.contributor.author	Siskos, Stylianos	el
dc.contributor.author	Dimitriadis, Charalampos	el
dc.contributor.author	Papadopoulos, Nikolaos	el
dc.contributor.author	Papakostas, Dimitrios	el
dc.contributor.other	Παπακώστας, Δημήτριος	el
dc.contributor.other	Χατζόπουλος, Αλκιβιάδης	el
dc.contributor.other	Σίσκος, Στυλιανός	el
dc.contributor.other	Παπαδόπουλος, Νικόλαος	el
dc.contributor.other	Δημητριάδης, Χαράλαμπος	el
dc.date.accessioned	2015-07-16T09:01:10Z	el
dc.date.accessioned	2018-02-28T16:16:46Z	-
dc.date.available	2015-07-16T09:01:10Z	el
dc.date.available	2018-02-28T16:16:46Z	-
dc.date.issued	2006-05	el
dc.identifier	doi:10.1016/j.mejo.2006.07.014	el
dc.identifier.citation	Journal: Microelectronics Journal, vol.37, no.11, 2006	el
dc.identifier.citation	Papakostas, D., Hatzopoulos, A., Papadopoulos, N., Siskos, S. and Dimitriadis, C. (2006). Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. Microelectronics Journal [online]. 37(11), pp.1313-1320. Διαθέσιμο σε: http://www.sciencedirect.com/science/article/pii/S0026269206001558 [Ανακτήθηκε 19 Ιουλίου 2015]	el
dc.identifier.citation	International Symposium on Circuits and Systems, Kos, 2006	el
dc.identifier.issn	0026-2692	el
dc.identifier.uri	http://195.251.240.227/jspui/handle/123456789/10060	-
dc.description	Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2006	el
dc.description.abstract	The impact of the light illumination on the drain current of polycrystalline silicon thin-film transistors (TFT) is studied in this work. The increase of the output current as a result of raised light intensity is modeled, based on measured experimental data for different Vds and Vgs values and transistor sizes W/L. The proposed model has been verified against the measurements and the simulated output characteristics give a good approximation in the sub-threshold region.	el
dc.language.iso	en	el
dc.publisher	Elsevier	el
dc.relation.isbasedon	2006 International Symposium on Circuits and Systems	el
dc.rights	This item is probably protected by Copyright Legislation	el
dc.rights	Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία	el
dc.source.uri	http://www.sciencedirect.com/science/journal/00262692/37/11	el
dc.title	Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region	el
dc.type	Conference article	el
heal.type	other	el
heal.type.en	Other	en
heal.dateAvailable	2018-02-28T16:17:46Z	-
heal.language	el	el
heal.access	free	el
heal.recordProvider	ΤΕΙ Θεσσαλονίκης	el
heal.fullTextAvailability	false	el
heal.type.el	Άλλο	el
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Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region