Analogue Measurements Fault Detectability using Probabilistic Analysis

Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης


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dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.date.accessioned2015-07-16T09:22:03Zel
dc.date.accessioned2018-02-28T16:16:46Z-
dc.date.available2015-07-16T09:22:03Zel
dc.date.available2018-02-28T16:16:46Z-
dc.date.issued2006-11el
dc.identifier.citationPapakostas, D. and Hatzopoulos, A. (2006). Analogue Measurements Fault Detectability using Probabilistic Analysis. In: Conference on Design of Circuits and Integrated Systems: conference proceedings, Barcelona, 2006. Barcelona: DCIS.el
dc.identifier.citationConference on Design of Circuits and Integrated Systems, Barcelona, 2006el
dc.identifier.isbn978-84-690-4144-4el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10061-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2006el
dc.language.isoenel
dc.relation.ispartof21 Conference on Design of Circuits and Integrated Systemsel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.titleAnalogue Measurements Fault Detectability using Probabilistic Analysisel
dc.typeConference articleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:46Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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