Analogue Measurements Fault Detectability using Probabilistic Analysis
Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hatzopoulos, Alkiviadis | el |
dc.contributor.author | Papakostas, Dimitrios | el |
dc.contributor.other | Παπακώστας, Δημήτριος | el |
dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
dc.date.accessioned | 2015-07-16T09:22:03Z | el |
dc.date.accessioned | 2018-02-28T16:16:46Z | - |
dc.date.available | 2015-07-16T09:22:03Z | el |
dc.date.available | 2018-02-28T16:16:46Z | - |
dc.date.issued | 2006-11 | el |
dc.identifier.citation | Papakostas, D. and Hatzopoulos, A. (2006). Analogue Measurements Fault Detectability using Probabilistic Analysis. In: Conference on Design of Circuits and Integrated Systems: conference proceedings, Barcelona, 2006. Barcelona: DCIS. | el |
dc.identifier.citation | Conference on Design of Circuits and Integrated Systems, Barcelona, 2006 | el |
dc.identifier.isbn | 978-84-690-4144-4 | el |
dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10061 | - |
dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2006 | el |
dc.language.iso | en | el |
dc.relation.ispartof | 21 Conference on Design of Circuits and Integrated Systems | el |
dc.rights | This item is probably protected by Copyright Legislation | el |
dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
dc.title | Analogue Measurements Fault Detectability using Probabilistic Analysis | el |
dc.type | Conference article | el |
heal.type | other | el |
heal.type.en | Other | en |
heal.dateAvailable | 2018-02-28T16:17:46Z | - |
heal.language | el | el |
heal.access | free | el |
heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
heal.fullTextAvailability | false | el |
heal.type.el | Άλλο | el |
Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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http://195.251.240.227/jspui/handle/123456789/10061
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