Estimating the influence of light on the performance of  polycrystalline thin-film transistors at the  sub-threshold region

Estimating the influence of light on the performance of polycrystalline thin-film transistors at the sub-threshold region

Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Papadopoulos, Nikolaos/ Dimitriadis, Charalampos/ Siskos, Stylianos/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Παπαδόπουλος, Νικόλαος/ Σίσκος, Στυλιανός/ Δημητριάδης, Χαράλαμπος

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DC Field	Value	Language
dc.contributor.author	Hatzopoulos, Alkiviadis	el
dc.contributor.author	Papakostas, Dimitrios	el
dc.contributor.author	Papadopoulos, Nikolaos	el
dc.contributor.author	Dimitriadis, Charalampos	el
dc.contributor.author	Siskos, Stylianos	el
dc.contributor.other	Παπακώστας, Δημήτριος	el
dc.contributor.other	Χατζόπουλος, Αλκιβιάδης	el
dc.contributor.other	Παπαδόπουλος, Νικόλαος	el
dc.contributor.other	Σίσκος, Στυλιανός	el
dc.contributor.other	Δημητριάδης, Χαράλαμπος	el
dc.date.accessioned	2015-07-15T16:55:06Z	el
dc.date.accessioned	2018-02-28T16:16:47Z	-
dc.date.available	2015-07-15T16:55:06Z	el
dc.date.available	2018-02-28T16:16:47Z	-
dc.date.issued	2006-05	el
dc.identifier	10.1109/MELCON.2006.1653061	el
dc.identifier.citation	Mediterranean Electrotechnical Conference, Malaga, 2006	el
dc.identifier.citation	Papakostas, D., Hatzopoulos, A., Siskos, S., Papadopoulos, N. and Dimitriadis, C. (2006). Estimating the influence of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. In 13th Mediterranean Electrotechnical Conference: conference proceedings, Malaga, 2006. Malaga: IEEE, pp.161-164.	el
dc.identifier.isbn	1-4244-0087-2	el
dc.identifier.uri	http://195.251.240.227/jspui/handle/123456789/10068	-
dc.description	Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2006	el
dc.description.abstract	The impact of the light illumination on the drain current of polycrystalline silicon thin-film transistors is studied in this work. The increase of the output current as a result of raised light intensity is modeled, based on measured experimental data for different Vds , Vgs values and transistor sizes W/L. The proposed model has been verified against the measurements and the simulated output characteristics give a good approximation in the sub-threshold region.	el
dc.language.iso	en	el
dc.relation.ispartof	13th IEEE Mediterranean Electrotechnical Conference	el
dc.rights	This item is probably protected by Copyright Legislation	el
dc.rights	Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία	el
dc.subject	thin film transistors	el
dc.subject	elemental semiconductors	el
dc.subject	silicon	el
dc.title	Estimating the influence of light on the performance of polycrystalline thin-film transistors at the sub-threshold region	el
dc.type	Article	el
heal.type	other	el
heal.type.en	Other	en
heal.dateAvailable	2018-02-28T16:17:47Z	-
heal.language	el	el
heal.access	free	el
heal.recordProvider	ΤΕΙ Θεσσαλονίκης	el
heal.fullTextAvailability	false	el
heal.type.el	Άλλο	el
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Estimating the influence of light on the performance of polycrystalline thin-film transistors at the sub-threshold region