Analog and Mixed-Signal Testing by Wavelet Transformation of Power Supply Current Measurements
Konstantinou, Dimitrios/ Vassios, Vasilios/ Hatzopoulos, Alkiviadis/ Dimopoulos, Michael/ Spyronasios, Alexios/ Papakostas, Dimitrios/ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος/ Σπυρονάσιος, Αλέξιος/ Βάσσιος, Βασίλειος/ Δημόπουλος, Μιχαήλ/ Κωνσταντίνου, Δημήτριος
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Konstantinou, Dimitrios | el |
| dc.contributor.author | Vassios, Vasilios | el |
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Dimopoulos, Michael | el |
| dc.contributor.author | Spyronasios, Alexios | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Σπυρονάσιος, Αλέξιος | el |
| dc.contributor.other | Βάσσιος, Βασίλειος | el |
| dc.contributor.other | Δημόπουλος, Μιχαήλ | el |
| dc.contributor.other | Κωνσταντίνου, Δημήτριος | el |
| dc.date.accessioned | 2015-07-17T13:41:18Z | el |
| dc.date.accessioned | 2018-02-28T16:16:48Z | - |
| dc.date.available | 2015-07-17T13:41:18Z | el |
| dc.date.available | 2018-02-28T16:16:48Z | - |
| dc.date.issued | 2009-06 | el |
| dc.identifier.citation | Papakostas, D., Dimopoulos, M., Spyronasios, A., Konstantinou, D., Hatzopoulos, A. and Vassios, V. (2009). Analog and Mixed-Signal Testing by Wavelet Transformation of Power Supply Current Measurements. In: International Conference Mixed Design of Integrated Circuits and Systems: conference proceedings, Lodz, 2009. Lodz: IEEE. | el |
| dc.identifier.citation | International Conference Mixed Design of Integrated Circuits and Systems, Lodz, 2009 | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10077 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2009 | el |
| dc.language.iso | en | el |
| dc.publisher | IEEE | el |
| dc.relation.ispartof | 16th International Conference Mixed Design of Integrated Circuits and Systems | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.title | Analog and Mixed-Signal Testing by Wavelet Transformation of Power Supply Current Measurements | el |
| dc.type | Conference article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:48Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
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