Input Stimulus Comparison using an Adaptive FPGA-based Testing System
Papakostas, Dimitrios/ Pouros, Sotirios/ Vassios, Vasilios/ Hatzopoulos, Alkiviadis/ Χατζόπουλος, Αλκιβιάδης/ Πούρος, Σωτήριος/ Βάσσιος, Βασίλειος/ Παπακώστας, Δημήτριος
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Papakostas, Dimitrios | el |
dc.contributor.author | Pouros, Sotirios | el |
dc.contributor.author | Vassios, Vasilios | el |
dc.contributor.author | Hatzopoulos, Alkiviadis | el |
dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
dc.contributor.other | Πούρος, Σωτήριος | el |
dc.contributor.other | Βάσσιος, Βασίλειος | el |
dc.contributor.other | Παπακώστας, Δημήτριος | el |
dc.date.accessioned | 2015-07-17T15:33:41Z | el |
dc.date.accessioned | 2018-02-28T16:16:48Z | - |
dc.date.available | 2015-07-17T15:33:41Z | el |
dc.date.available | 2018-02-28T16:16:48Z | - |
dc.date.issued | 2014-06 | el |
dc.identifier | 10.1109/ISCAS.2014.6865119 | el |
dc.identifier.citation | International Symposium on Circuits and Systems, Melbourne, 2014 | el |
dc.identifier.citation | Papakostas, D., Hatzopoulos, A., Vassios, V. and Pouros, S. (2014). Input Stimulus Comparison using an Adaptive FPGA-based Testing System. In: International Symposium on Circuits and Systems: conference proceedings, Melbourne, 2014. [S.l.]: IEEE, pp.277-280. | el |
dc.identifier.isbn | 978-1-4799-3431-7 | el |
dc.identifier.issn | 978-1-4799-3431-7 | el |
dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10082 | - |
dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2014 | el |
dc.description.abstract | In this paper the comparison of input stimulus signals using an adaptive FPGA-based testing system based on a method utilising wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme. | el |
dc.language.iso | en | el |
dc.publisher | IEEE | el |
dc.relation.ispartof | 2014 IEEE International Symposium on Circuits and Systems | el |
dc.rights | This item is probably protected by Copyright Legislation | el |
dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
dc.subject | Fault diagnosis | el |
dc.subject | Field programmable gate arrays | el |
dc.subject | Wavelet transforms | el |
dc.title | Input Stimulus Comparison using an Adaptive FPGA-based Testing System | el |
dc.type | Conference article | el |
heal.type | other | el |
heal.type.en | Other | en |
heal.dateAvailable | 2018-02-28T16:17:48Z | - |
heal.language | el | el |
heal.access | free | el |
heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
heal.fullTextAvailability | false | el |
heal.type.el | Άλλο | el |
Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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