Wavelet Analysis of Current Measurements for Mixed-Signal Circuit Testing
Hatzopoulos, Alkiviadis/ Vassios, Vasilios/ Dimopoulos, Michael/ Papakostas, Dimitrios/ Δημόπουλος, Μιχαήλ/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Βάσσιος, Βασίλειος
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Vassios, Vasilios | el |
| dc.contributor.author | Dimopoulos, Michael | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Δημόπουλος, Μιχαήλ | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.contributor.other | Βάσσιος, Βασίλειος | el |
| dc.date.accessioned | 2015-07-17T16:12:10Z | el |
| dc.date.accessioned | 2018-02-28T16:16:48Z | - |
| dc.date.available | 2015-07-17T16:12:10Z | el |
| dc.date.available | 2018-02-28T16:16:48Z | - |
| dc.date.issued | 2010-06 | el |
| dc.identifier | 10.1109/ISCAS.2010.5537999 | el |
| dc.identifier.citation | Papakostas, D., Hatzopoulos, A., Dimopoulos, M. and Vassios, V. (2010). Wavelet Analysis of Current Measurements for Mixed-Signal Circuit Testing. In: International Symposium on Circuits and Systems: conference proceedings, Paris, 2010. Paris: IEEE, pp.1923-1926. | el |
| dc.identifier.citation | International Symposium on Circuits and Systems, Paris, 2010 | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10083 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2010 | el |
| dc.description.abstract | In this paper a test method based on the wavelet transformation of the measured supply current (IPS) and load current (IL) waveforms is presented. In the wavelet analysis, the test metrics used are utilizing the initial three decomposition levels of the measured signal. Experimental comparative results between the proposed method, a test method based on the RMS value of IPS, a test method utilizing the harmonic magnitude components of the IPS spectrum and a method based on the wavelet transformation of the IPS are presented showing the effectiveness of the proposed testing scheme. | el |
| dc.language.iso | en | el |
| dc.publisher | IEEE | el |
| dc.relation.ispartof | International Symposium on Circuits and Systems | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.subject | Mixed analogue-digital integrated circuits | el |
| dc.subject | Integrated circuit testing | el |
| dc.subject | Electric current measurement | el |
| dc.subject | Wavelet transforms | el |
| dc.title | Wavelet Analysis of Current Measurements for Mixed-Signal Circuit Testing | el |
| dc.type | Conference article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:48Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
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http://195.251.240.227/jspui/handle/123456789/10083
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