Current Spectrum Measurements for Analog Fault Diagnosis

Ioannou, A./ Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Ιωάννου, Α.


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dc.contributor.authorIoannou, A.el
dc.contributor.authorPapakostas, Dimitriosel
dc.contributor.authorHatzopoulos, Alkiviadisel
dc.contributor.otherΠαπακώστας, Δημήτριοςel
dc.contributor.otherΧατζόπουλος, Αλκιβιάδηςel
dc.contributor.otherΙωάννου, Α.el
dc.date.accessioned2015-07-07T09:43:00Zel
dc.date.accessioned2018-02-28T16:16:48Z-
dc.date.available2015-07-07T09:43:00Zel
dc.date.available2018-02-28T16:16:48Z-
dc.date.issued1995-10el
dc.identifier.citationPapakostas, D., Hatzopoulos, A., and Ioannou, A. (1995). Current Spectrum Measurements for Analog Fault Diagnosis. In: IEEE International Workshop on IDDQ Testing: conference proceedings, Washington, 1995. [S.1.]: IEEE, pp.114-115.el
dc.identifier.citationInternational Workshop on IDDQ Testing, Washington, 1995el
dc.identifier.urihttp://195.251.240.227/jspui/handle/123456789/10084-
dc.descriptionΔημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1995el
dc.language.isoenel
dc.relation.ispartof1995 International Workshop on IDDQ Testingel
dc.rightsThis item is probably protected by Copyright Legislationel
dc.rightsΤο τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσίαel
dc.titleCurrent Spectrum Measurements for Analog Fault Diagnosisel
dc.typeConference articleel
heal.typeotherel
heal.type.enOtheren
heal.dateAvailable2018-02-28T16:17:48Z-
heal.languageelel
heal.accessfreeel
heal.recordProviderΤΕΙ Θεσσαλονίκηςel
heal.fullTextAvailabilityfalseel
heal.type.elΆλλοel
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