Multiple Parametric Circuit Analysis Tool for Detectability Estimation
Konstantinou, Dimitrios/ Spyronasios, Alexios/ Dimopoulos, Michael/ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Κωνσταντίνου, Δημήτριος/ Σπυρονάσιος, Αλέξιος/ Δημόπουλος, Μιχαήλ/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Konstantinou, Dimitrios | el |
| dc.contributor.author | Spyronasios, Alexios | el |
| dc.contributor.author | Dimopoulos, Michael | el |
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.other | Κωνσταντίνου, Δημήτριος | el |
| dc.contributor.other | Σπυρονάσιος, Αλέξιος | el |
| dc.contributor.other | Δημόπουλος, Μιχαήλ | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.date.accessioned | 2015-07-17T10:22:22Z | el |
| dc.date.accessioned | 2018-02-28T16:16:49Z | - |
| dc.date.available | 2015-07-17T10:22:22Z | el |
| dc.date.available | 2018-02-28T16:16:49Z | - |
| dc.date.issued | 2007-12 | el |
| dc.identifier | 10.1109/ICECS.2007.4511189 | el |
| dc.identifier.citation | Papakostas, D., Hatzopoulos, A., Dimopoulos, M., Spyronasios, A. and Konstantinou, D. (2007). Multiple Parametric Circuit Analysis Tool for Detectability Estimation. In: International Conference On Electronics, Circuits, and Systems: conference proceedings, Marrakech, 2007. [S.l.]: IEEE, pp.1111-1114. | el |
| dc.identifier.citation | International Conference On Electronics, Circuits, and Systems, Marrakech, 2007 | el |
| dc.identifier.isbn | 978-1-4244-1377-5 | el |
| dc.identifier.isbn | 978-1-4244-1378-2 | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10086 | - |
| dc.description.abstract | In this paper a software tool is presented which is capable of producing testability metrics for analog and mixed-signal circuits. These metrics are obtained by performing probabilistic analysis techniques. The presented tool acts as a shell utilizing the power of state of the art external schematic and simulation programs and offers to the user a graphical interface for circuit design and test. This interface is transparent to the user elaborately hiding all the complex task manipulations. Preliminary results are presented showing the effectiveness of the proposed scheme. | el |
| dc.description.sponsorship | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2007 | el |
| dc.language.iso | en | el |
| dc.relation.ispartof | 14th International Conference On Electronics, Circuits, and Systems | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.subject | Circuit analysis computing | el |
| dc.subject | Circuit testing | el |
| dc.subject | Software tools | el |
| dc.subject | Graphical user interfaces | el |
| dc.title | Multiple Parametric Circuit Analysis Tool for Detectability Estimation | el |
| dc.type | Conference article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:49Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
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http://195.251.240.227/jspui/handle/123456789/10086
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