Wavelet-based Mixed-Signal Testing using Supply Current Measurements
Spyronasios, Alexios/ Hatzopoulos, Alkiviadis/ Konstantinou, Dimitrios/ Papakostas, Dimitrios/ Dimopoulos, Michael/ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος/ Σπυρονάσιος, Αλέξιος/ Κωνσταντίνου, Δημήτριος/ Δημόπουλος, Μιχαήλ
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Spyronasios, Alexios | el |
| dc.contributor.author | Hatzopoulos, Alkiviadis | el |
| dc.contributor.author | Konstantinou, Dimitrios | el |
| dc.contributor.author | Papakostas, Dimitrios | el |
| dc.contributor.author | Dimopoulos, Michael | el |
| dc.contributor.other | Χατζόπουλος, Αλκιβιάδης | el |
| dc.contributor.other | Παπακώστας, Δημήτριος | el |
| dc.contributor.other | Σπυρονάσιος, Αλέξιος | el |
| dc.contributor.other | Κωνσταντίνου, Δημήτριος | el |
| dc.contributor.other | Δημόπουλος, Μιχαήλ | el |
| dc.date.accessioned | 2015-07-17T13:22:11Z | el |
| dc.date.accessioned | 2018-02-28T16:16:49Z | - |
| dc.date.available | 2015-07-17T13:22:11Z | el |
| dc.date.available | 2018-02-28T16:16:49Z | - |
| dc.date.issued | 2008-11 | el |
| dc.identifier.citation | Papakostas, D., Hatzopoulos, A., Spyronasios, A., Dimopoulos, M. and Konstantinou,D. (2008). Wavelet-based Mixed-Signal Testing using Supply Current Measurements. In: Conference on Design of Circuits and Integrated Systems: conference proceedings, Grenoble, 2008. [S.l.: s.n.], pp.5-8. | el |
| dc.identifier.citation | Conference on Design of Circuits and Integrated Systems, Grenoble, 2008 | el |
| dc.identifier.uri | http://195.251.240.227/jspui/handle/123456789/10088 | - |
| dc.description | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2008 | el |
| dc.language.iso | en | el |
| dc.relation.ispartof | 23th Conference on Design of Circuits and Integrated Systems | el |
| dc.rights | This item is probably protected by Copyright Legislation | el |
| dc.rights | Το τεκμήριο πιθανώς υπόκειται σε σχετική με τα Πνευματικά Δικαιώματα νομοθεσία | el |
| dc.title | Wavelet-based Mixed-Signal Testing using Supply Current Measurements | el |
| dc.type | Conference article | el |
| heal.type | other | el |
| heal.type.en | Other | en |
| heal.dateAvailable | 2018-02-28T16:17:49Z | - |
| heal.language | el | el |
| heal.access | free | el |
| heal.recordProvider | ΤΕΙ Θεσσαλονίκης | el |
| heal.fullTextAvailability | false | el |
| heal.type.el | Άλλο | el |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά | |
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http://195.251.240.227/jspui/handle/123456789/10088
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