Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Item Type
Advanced Search
Useful
Links
Information
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
Saved Searches
Favorites
Eureka! Institutional Repository
Eureka! Institutional Repository
Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
Saved Searches
Save this search
Go!
Discover
Author
7
Dimopoulos, Michael
7
Hatzopoulos, Alkiviadis
7
Papakostas, Dimitrios
6
Spyronasios, Alexios
1
Goudelis, George
1
Stathis, Sotirios
1
Vassios, Vasilios
Subject
3
Circuit testing
2
Fault diagnosis
1
Analogue integrated circuits
1
Circuit analysis computing
1
Circuit simulation
1
Electric current measurement
1
Electrical products industry
1
Emergency lighting
1
Emergency power supply
1
Fault simulation
.
next >
Date issued
2
2009
4
2008
1
2007
Item Type
7
other
Search
Search:
All of DSpace
Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
Τμήμα Ηλεκτρονικών Μηχανικών
Δημοσιεύσεις ΕΠ
Διδακτορικές Διατριβές
Μεταπτυχιακές Διατριβές
Ορκομωσίες
Πτυχιακές Εργασίες
Σημειώσεις Μαθημάτων
for
Search only items with full text availability
Current filters:
Title
Author
Subject
Date Issued
Item Type
Date
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Clear current filters
or
Add more filters
Title
Author
Subject
Date Issued
Item Type
Date
Equals
Contains
ID
Not Equals
Not Contains
Not ID
View Option
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort items by
Relevance
Title
Issue Date
In order
Ascending
Descending
Authors/record
All
1
5
10
15
20
25
30
35
40
45
50
Results 1-7 of 7 (Search time: 0.003 seconds).
previous
1
next
Analog and Mixed-Signal Testing by Wavelet Transformation of Power Supply Current Measurements
Testing an Emergency Luminaire Circuit using Fault Dictionary Approach
Pattern Recognition Methods Application for Analog Circuit Fault Detection
Simulation and Measurements for Testing an Emergency Luminaire Circuit
Power Supply Current Testing in the Production Line of Emergency Luminaire Circuits
Multiple Parametric Circuit Analysis Tool for Detectability Estimation
Wavelet-based Mixed-Signal Testing using Supply Current Measurements