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Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
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Author
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Hatzopoulos, Alkiviadis
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Papakostas, Dimitrios
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Kosmidis, V.
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Fault diagnosis
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Analogue integrated circuits
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Circuit simulation
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Analogue-digital conversion
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Automatic testing
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Circuit analysis computing
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Delays
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Fourier analysis
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Integrated circuit measurement
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Mixed analogue-digital integrated...
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2004
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1999
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1996
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Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
Τμήμα Ηλεκτρονικών Μηχανικών
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Analog Fault Detectability based on Statistical Circuit Analysis
Detection of Time Delay Related Faults using Fourier Phase Components of Power Supply Current
Estimation of Statistical Variables for analogue fault detectability evaluation