Current-based Testing of Optical Feedback Pixel Driver
Papadopoulos, Nikolaos/ Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης/ Παπαδόπουλος, Νικόλαος
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Keywords: | Thin film transistors;Pulse width modulation;Organic light emitting diodes;Optical feedback;Driver circuits;Circuit testing |
| Issue Date: | Apr-2010 |
| Publisher: | IEEE |
| Citation: | Papakostas, D., Papadopoulos, N. and Hatzopoulos, A. (2010). Current-based Testing of Optical Feedback Pixel Driver. Journal of Display Technology [online]. 6(4), pp.150-157. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5438918&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F9425%2F5431077%2F05438918.pdf%3Farnumber%3D5438918 [Ανακτήθηκε 19 Ιουλίου 2015] Journal: Journal of Display Technology, vol.6, no.4, 2010 |
| Abstract: | A testing scheme of an optical feedback pixel driver is proposed, discussed and simulated by HSPICE. A basic characteristic of the specific circuit is that the gray scales of the pixel are created by pulse width modulation. So, the integral of the output I pixel current (which is proportional to I oled) has to be measured or calculated and used for testing. The testing procedure that is proposed enables the detection and identification of common processing defects up to 96%, as verified from simulation results. Although I pixel current is tend to be very low, the measuring system used, using special instrumentation ICs, is successfully simulated and verified by HSPICE. |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2010 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10026 |
| ISSN: | 1551-319X |
| Other Identifiers: | 10.1109/JDT.2009.2039986 |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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