Testing of Analog and Mixed-Signal Circuits by using Supply Current Measurements
Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Iatrou, E./ Katsaras, C./ Παπακώστας, Δημήτριος/ Ιατρού, Ε./ Χατζόπουλος, Αλκιβιάδης/ Κατσάρας, Χ.
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Keywords: | Electric current measurement;Mixed analogue-digital integrated circuits;Analogue integrated circuits;Fault diagnosis;Integrated circuit testing |
| Issue Date: | Oct-1998 |
| Publisher: | Institution of Education and Technology |
| Citation: | Journal: Circuits, Devices and Systems, IEE Proceedings, vol.145, no.5, 1998 Papakostas, D., Chatzopoulos, A., Iatrou, E. and Katsaras, C. (1998). Testing of Analog and Mixed-Signal Circuits by using Supply Current Measurements. Circuits, Devices and Systems, IEE Proceedings [online]. 45(5), pp.319-324. Διαθέσιμο σε: http://www.ieeeexplore.ws/xpl/articleDetails.jsp?&arnumber=739674 [Ανακτήθηκε 19 Ιουλίου 2015] |
| Abstract: | A complete (hardware and software) system has been designed and implemented, which can measure the supply current (IPS) of analogue and mixed-mode circuits and detect or diagnose faults, based on RMS and spectrum calculations of the IPS and the corresponding fault dictionary. The system is applied to testing and diagnosis of various analogue and mixed-signal circuits, showing very encouraging results. |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1998 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10051 |
| ISSN: | 1359-7000 1350-2409 |
| Other Identifiers: | 10.1049/ip-cds:19982118 |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
Files in This Item:
There are no files associated with this item.
Please use this identifier to cite or link to this item:
This item is a favorite for 0 people.
http://195.251.240.227/jspui/handle/123456789/10051
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
