Analog Fault Detectability based on Statistical Circuit Analysis
Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Kosmidis, V./ Χατζόπουλος, Αλκιβιάδης/ Παπακώστας, Δημήτριος/ Κοσμίδης, Β.
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Keywords: | Statistical analysis;Monte Carlo methods;Analogue integrated circuits;Automatic testing;Circuit analysis computing;Fault diagnosis;Integrated circuit testing;Probability |
| Issue Date: | Oct-1996 |
| Publisher: | IEEE |
| Citation: | Papakostas, D., Hatzopoulos, A. and Kosmidis, V. (1996). Analog fault detectability based on statistical circuit analysis. IEEE International Conference on Electronics, Circuits, and Systems [online]. vol.5, pp.1076-1079. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=584607&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D584607 [Ανακτήθηκε 19 Ιουλίου 2015] International Conference on Electronics Circuits and Systems, Rhodes, 1996 |
| Abstract: | Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability of various analog measurements. Since the method is a simulation-before-test approach, its computational complexity can be considered acceptable utilizing modern computer systems. Parameter deviations and multiple Monte-Carlo analysis are properly handled by a shell program, named MPCAP, which uses the SPICE simulator as a kernel. Theoretical analysis for the calculation of the probabilities is given, along with simulation results from an analog filter example. |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,1996 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10052 |
| ISSN: | 0-7803-3650-X |
| Other Identifiers: | 10.1109/ICECS.1996.584607 |
| Item type: | other |
| Submission Date: | 2018-02-28T16:17:45Z |
| Item language: | el |
| Item access scheme: | free |
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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