Fault Detectability of Double Analogue Measurements using Probabilistic Analysis

Abstract

Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability in cases where double analogue measurements are utilized. Theoretical analysis for the estimation of the detectability is given, based on conditional probability calculations. The proposed technique can also be applied for test measurement selection. Simulation results from the application of the method on an analogue filter circuit are given, showing a sufficient improvement over the detectability achieved by single measurements.