Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluation
Papakostas, Dimitrios/ Hatzopoulos, Alkiviadis/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Issue Date: | Jun-2007 |
| Citation: | Papakostas, D. and Hatzopoulos, A. (2007). Impact Of Circuit Parameter Derivative Calculation on Estimation of Statistical Variables for Analog Fault Detectability Evaluation. In: International Mixed Signal Testing Workshop: conference proceedings, Portugal, 2007. [S.l.]: IEEE, pp.37-41. International Mixed Signal Testing Workshop, Portugal, 2007 |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2007 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10069 |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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http://195.251.240.227/jspui/handle/123456789/10069
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