Circuit Testing Method Based on Wavelets

Abstract

The paper presents the comparison of waveforms for the input stimulus of a circuit under test, using a testing system incorporated in an FPGA, relying on a method based on wavelet transformation of the supply current or load current waveforms. The method differentiates due to the incorporation of different signal inputs according to the needs of the tester and the specifications of the circuit. This is a distinctive and effective method that offers a single– point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results, derived from measurement comparisons, are presented showing the effectiveness of the proposed testing scheme.