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Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
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16
Papakostas, Dimitrios
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Hatzopoulos, Alkiviadis
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Vassios, Vasilios
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Pouros, Sotirios
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Dimopoulos, Michael
4
Spyronasios, Alexios
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Histov, Valentin
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Papadopoulos, Nikolaos
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Παπακώστας, Δημήτριος
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Bamnios, George
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Wavelet transforms
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Circuit testing
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Fault diagnosis
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Analogue circuits
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Electric current measurement
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Field programmable gate arrays
2
Microcontrollers
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Optical feedback
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Thin film transistors
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Analogue fault coverage
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Σχολή Τεχνολογικών Εφαρμογών (ΣΤΕΦ)
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FPGAs and Wavelets on Circuit Testing Based on Current Signal Measurements
On the Design of an FPGA-based Mixed-Signal Circuits Testing System
Selecting input current waveforms using a hardware testing implementation incorporated in FPGAs
Input Stimulus Comparison using an Adaptive FPGA-based Testing System
Wavelet Analysis of Current Measurements for Mixed-Signal Circuit Testing
FPGA-Based Mixed-Signal Circuits Testing System Implementation
Using the Light-impact Model for p-type and n-type poly-TFT in Circuits
Support Vector Machine Methods Application for Analog & Mixed-Signal Circuit Fault Detection