Impact of Parameter Covariance on Fault Detectability Estimation of Analog and Mixed-Mode Circuits

Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης


Institution and School/Department of submitter: ΤΕΙ Θεσσαλονίκης
Keywords: Mixed analogue-digital integrated circuits;Fault diagnosis;Network parameters;Circuit simulation
Issue Date: Oct-2003
Publisher: Institution of Education and Technology
Citation: Journal: Circuits, Devices and Systems, IEE Proceedings, vol.150, no.5, 2003
Papakostas, D. and Hatzopoulos, A. (2003). Impact of Parameter Covariance on Fault Detectability Estimation of Analog and Mixed-Mode Circuits. Circuits, Devices and Systems, IEE Proceedings [online]. 150(5), pp.434-438. Διαθέσιμο σε: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=1251665&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F2190%2F28023%2F01251665.pdf%3Farnumber%3D1251665 [Ανακτήθηκε 19 Ιουλίου 2015]
Abstract: An extension to the method for estimating the fault detection probability, in order to include circuit parameters with covariance, is studied. The enhanced method takes into account the statistical variations and matching dependencies between circuit parameters and gives quite accurate and realistic results, while additional circuit simulations, compared to the previous method, are needed. The method is applied for the estimation of fault detectability in a simulation-before-test approach. Comparative results from analogue and mixed-mode circuits are presented to evaluate the contribution of the extended formulation.
Description: Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2003
URI: http://195.251.240.227/jspui/handle/123456789/10025
ISSN: 1350-2409
1359-7000
Other Identifiers: 10.1049/ip-cds:20030579
Appears in Collections:Δημοσιεύσεις σε Περιοδικά

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