Analogue Measurements Fault Detectability using Probabilistic Analysis
Hatzopoulos, Alkiviadis/ Papakostas, Dimitrios/ Παπακώστας, Δημήτριος/ Χατζόπουλος, Αλκιβιάδης
| Institution and School/Department of submitter: | ΤΕΙ Θεσσαλονίκης |
| Issue Date: | Nov-2006 |
| Citation: | Papakostas, D. and Hatzopoulos, A. (2006). Analogue Measurements Fault Detectability using Probabilistic Analysis. In: Conference on Design of Circuits and Integrated Systems: conference proceedings, Barcelona, 2006. Barcelona: DCIS. Conference on Design of Circuits and Integrated Systems, Barcelona, 2006 |
| Description: | Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών,2006 |
| URI: | http://195.251.240.227/jspui/handle/123456789/10061 |
| ISBN: | 978-84-690-4144-4 |
| Appears in Collections: | Δημοσιεύσεις σε Περιοδικά |
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http://195.251.240.227/jspui/handle/123456789/10061
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