Collection's Items (Sorted by Submit Date in Descending order): 61 to 80 of 82
| Title | Author(s) | Issue date |
| Fault Identification in Analog Circuits using Current Spectrum Measurements | Ioannou, A.; Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Ιωάννου, Α. | 7-Jul-2015 |
| Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements | Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης | 7-Jul-2015 |
| Διάγνωση Βλαβών Ολοκληρωμένων Κυκλωμάτων | Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Papakostas, Dimitrios; Hatzopoulos, Alkiviadis | 6-Jul-2015 |
| Circuit Implementation of a Supply Current Spectrum Test Method | Spyronasios, Alexios; Hatzopoulos, Alkiviadis; Kostantinou, Dimitrios; Dimopoulos, Michael; Papakostas, Dimitrios; Δημόπουλος, Μιχαήλ; Κωνσταντίνου, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος; Σπυρονάσιος, Αλέξιος | 6-Jul-2015 |
| Wavelet Energy-based Testing using Supply Current Measurements | Dimopoulos, Michael; Spyronasios, Alexios; Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Δημόπουλος, Μιχαήλ; Σπυρονάσιος, Αλέξιος | 6-Jul-2015 |
| A Light-impact Model for p-type and n-type poly-Si TFTs | Siskos, Stylianos; Dimitriadis, Charalampos; Picos, Rodrigo; Papadopoulos, Nikolaos; Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Σίσκος, Στυλιανός; Δημητριάδης, Χαράλαμπος; Παπαδόπουλος, Νικόλαος | 6-Jul-2015 |
| Testing of Analog and Mixed-Signal Circuits by using Supply Current Measurements | Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Iatrou, E.; Katsaras, C.; Παπακώστας, Δημήτριος; Ιατρού, Ε.; Χατζόπουλος, Αλκιβιάδης; Κατσάρας, Χ. | 6-Jul-2015 |
| Μελέτη Υπογραφών Ρεύματος και Τάσης και Μεθόδων Στατιστικής για την Εξέταση Βλαβών Αναλογικών Κυκλωμάτων με Υπολογιστή | Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος | 3-Jul-2015 |
| Current-based Testing of Optical Feedback Pixel Driver | Papadopoulos, Nikolaos; Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Παπαδόπουλος, Νικόλαος | 3-Jul-2015 |
| Fault Tolerance Limits and Input Stimulus Selection using an Implemented FPGA-based Testing System | Vassios, Vasilios; Pouros, Sotirios; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Πούρος, Σωτήριος; Βάσσιος, Βασίλειος | 3-Jul-2015 |
| An Improved Optical Feedback Pixel Driver Circuit | Papadopoulos, Nikolaos; Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης; Παπαδόπουλος, Νικόλαος | 3-Jul-2015 |
| Κατασκευή συστήματος διάγνωσης βλαβών αναλογικών κυκλωμάτων και εξαρτημάτων | Παπακώστας, Δημήτριος; Papakostas, Dimitrios | 3-Jul-2015 |
| Improved Analogue Fault Coverage Estimation using Probabilistic Analysis | Chatzopoulos, Alkiviadis; Papakostas, Dimitrios; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος | 3-Jul-2015 |
| A Unified Procedure for Fault Detection of Analogue and Mixed-mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum | Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης | 3-Jul-2015 |
| Analogue Fault Detectability Comparison Between Power Supply Current and Output Voltage Magnitude and Phase Spectrum Components | Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης | 3-Jul-2015 |
| Detection of Time Delay Related Faults using Fourier Phase Components of Power Supply Current | Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Χατζόπουλος, Αλκιβιάδης; Παπακώστας, Δημήτριος | 3-Jul-2015 |
| Impact of Parameter Covariance on Fault Detectability Estimation of Analog and Mixed-Mode Circuits | Hatzopoulos, Alkiviadis; Papakostas, Dimitrios; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης | 3-Jul-2015 |
| Estimation of Circuit Output Measurements including Statistically Depended Parameters | Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης | 3-Jul-2015 |
| Estimation of Statistical Variables for analogue fault detectability evaluation | Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης | 3-Jul-2015 |
| Supply current testing in linear bipolar ICs | Papakostas, Dimitrios; Hatzopoulos, Alkiviadis; Παπακώστας, Δημήτριος; Χατζόπουλος, Αλκιβιάδης | 3-Jul-2015 |
